Contact-less Integrity Verification of Microelectronics Using Near-Field EM Analysis

Modern microelectronics life-cycle and supply chain ecosystem bring multiple untrusted entities, which can compromise their integrity. A major integrity issue of stems from piracy intellectual properties (IP) counterfeiting, causes significant revenue loss to the semiconductor manufacturers. Further, these components often lead compromised functionality, reliability, security, safety an electronic system. This paper presents secure information transmission probing methods for verifying digital integrated circuit (ICs) based on electromagnetic (EM) near-field emissions thereby protecting systems against counterfeit components. The proposed method has been tested both high-level instructions executed by microprocessors or Systems-on-Chip (serving as examples software), also logic circuits within FPGA fabrics ASICs hardware). authentication required each system is generated using a pseudo-random number generator securely transmitted via magnetic emissions. authorized party probe probe, process acquired signals improve signal-to-noise ratio (SNR), then recover through matched filtering. Experimental results commercial SoCs are used demonstrate technique. Methods reducing EM interference during verification FPGAs described.